Seminar

Engineering Seminar Series 7, 2012: Low-Cost Automatic Visual Inspection System for Media in Hard Disk Drive Mass Production

Dr Melanie Ooi PL, lecturer from School of Engineering


Date: 2012-04-09
Time: 12:00 to 13:00
Venue: Classroom 9-3-04


Abstract

In the modern high-volume hard disk drive production process, if an assembled product fails the final test it is normally not just discarded, but is sent for Teardown, whereby it is disassembled to the constituent components. These components are thoroughly examined, and if pass the test, they are then used again in new products. Traditionally Laser Doppler Vibrometry has been employed for media surface inspection. At the same time, the laser Doppler vibrometer test is lengthy, thus reducing overall efficiency of the tear down process. In order to increase the tear down process efficiency, manual visual inspection is often performed as a preliminary filtering step. Such an arrangement is not optimal as it is open to human error factor, may be costly and has through put limitations. The aim of this research is to increase efficiency of the media surface inspection process during the tear down stage by replacing the manual media visual inspection with a proposed low-cost automatic visual inspection system. The paper explores the factors influencing successful and rapid image acquisition of micrometer level defects on a specular surface, namely camera spatial resolution, spectral properties, image system Signal to Noise Ratio (SNR), and lighting methods. A detection as well as classification scheme is proposed to classify four major types of commonly occurring HDD media defects.

About the Speaker

Melanie Po-Leen Ooi is a lecturer at Monash University, Sunway campus. She obtained First Class Honors for her BEng (Hons) degree from Monash University in 2003, and went on to complete her MEngSc (Research) and PhD degrees in the same university in 2006 and 2011 respectively. Through extensive collaboration with Freescale Semiconductor and Texas Instruments, she has developed new testing methodologies for integrated. Her areas of research include embedded hardware design, testing and design of microelectronic devices, image and signal processing, test measurement and instrumentation circuits where she has authored over 30 publications.