Seminar

Engineering Seminar Series 9_2010: Important Criteria in Choosing a Field Emission Scanning Electron Microscope

Mr Heng Lit Herng, Product Manager for FEI Products, in Crest Nanosolutions


Date: 2010-06-18
Time: 11:00 to 12:30
Venue: Video Conference Room 2-3-41


Abstract

Scanning Electron Microscopes (SEM) are used for inspecting topographies of materials with a magnification range that encompasses that of optical microscopy and extends it to the nanoscale. A variety of advanced scanning electron microscopes (SEM) are around to meet customer requirements and application needs. A scanning electron microscope (SEM) can scan the surface of a sample with a finely focused electron beam to produce an image from the beam-specimen interactions detected by a wide array of detectors. A variety of detectors are available, from secondary electron detectors to provide surface information, to backscattered detectors for compositional information in both high or low vacuum modes. Find out what you should know about a SEM.

About the Speaker